Composition and density measurement of doped DLCs using ion beam
poster presentation: Monday 2010-08-23 05:00 PM - 07:00 PM in section Nanostructure synthesis and modification
Last modified: 2010-06-02
Abstract
Density and composition are the most important properties which determine the mechanical and chemical properties of DLCs. However, for example, widely used density measurement using a weight of film and EDX composition measurement have inevitable error. In this study, we measured density and composition of various DLCs at a time using RBS-ERDA.
DLCs (a-C:H, ta-C, a-C:F and a-C:Si) were fabricated by filtered arc deposition method (PVD) or plasma based ion implantation and deposition method (CVD) on silicon wafer. The thickness of the films was measured by a stylus method. The RBS-ERDA measurement for the composition determination was performed at a time using 2.28MeV He+ with two detectors. The density was calculated with an energy loss of He atoms backscattered by a silicon substrate using SRIM code. For example, the calculated density of ta-C was 2.9-3.0 g/cm3 which corresponded to the value measured by X-ray reflectivity (XRR) method. In the paper, we will discuss the relationship among density, composition and mechanical properties of DLCs.
Author(s) affiliation:
Haruyuki Yasui, Industrial Research Institute of Ishikawa, Japan
*presenting author